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IC experts debate detection and testing technology development in Nantong

(chinadaily.com.cn) Updated: 2018-09-18
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Eight experts attend the Salon discussion part of the second International Summit on IC Testing and Testing Technology & Future Development in Nantong on Sept 7, 2018. [Photo/ime.ac.cn]

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Famous IC industry experts and representatives of enterprises attend the second International Summit on IC Testing and Testing Technology & Future Development in Nantong on Sept 7, 2018. [Photo/ime.ac.cn]

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