The second International Summit on Integrated Circuit (IC) Testing and Testing Technology and Future Development kicked off in Nantong on Sept 7.

Famous experts of the IC industry and representatives of enterprises attended the forum and discussed semiconductor devices and optical detection.

The forum was themed with IC detection and construction for testing platforms and Industrial chains. Six experts gave lectures on the current situation and developments in semiconductor device technology.

Nantong is making great efforts to build a “3+3+N” modern industrial system, taking the new generation of information technology industry as the leading and landmark industry. This forum’s professional interpretations and suggestions will guide the development of the new generation of information technology industry in Nantong. The city will further introduce and attract leading enterprises to drive the industries’ development. It will focus on the integration of information technology and manufacturing technology, improving automation, intelligence, networking, and digitization of the manufacturing industry to promote industrial transformation and upgrading. 

Cao Jianlin, on behalf of the president of the Integrated Circuit Industry Technology Innovation Alliance (ICTIA) gives a speech at the second International Summit on IC Testing and Testing Technology & Future Development in Nantong on Sept 7, 2018. [Photo/ime.ac.cn]